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Optimal metrology with programmable quantum sensors | JoVE Visualize

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Optimal metrology with programmable quantum sensors

Christian D Marciniak¹, Thomas Feldker¹, Ivan Pogorelov¹

¹Institut für Experimentalphysik, Innsbruck, Austria.

Nature|March 24, 2022

View abstract on PubMed

Summary

Researchers developed a programmable quantum sensor using entanglement to approach fundamental precision limits. This advanced quantum sensing technology significantly reduces measurement times compared to traditional methods.

Area of Science:

Quantum physics
Metrology
Quantum information processing

Background:

Quantum sensors offer new precision sensing opportunities.
Entanglement can enhance sensors to approach fundamental quantum limits.
Optimizing sensing platforms for ultimate precision remains a challenge.

Purpose of the Study:

To experimentally implement a programmable quantum sensor operating near fundamental quantum limits.
To merge quantum information processing with metrology for enhanced sensing.

Main Methods:

Utilizing low-depth, parametrized quantum circuits on a trapped-ion experiment.
Implementing optimal input states and measurement operators for sensing.
Employing on-device quantum-classical feedback for self-calibration.

Main Results:

Achieved sensing near the fundamental limit (factor of 1.45 ± 0.01) with 26 ions.
Outperformed conventional spin-squeezing by a factor of 1.87 ± 0.03.
Reduced the number of averages needed for a given Allan deviation by a factor of 1.59 ± 0.06.

Conclusions:

Demonstrated a programmable quantum sensor operating close to quantum mechanical limits.
The developed sensor surpasses traditional methods and spin-squeezing techniques.
Self-calibration via quantum-classical feedback enables device operation without prior environmental knowledge.

Quantum Physics

Quantum Technologies

Optimal Metrology With Programmable Quantum Sensors